Chin. J. Semicond. > 2002, Volume 23 > Issue 11 > 1187-1191
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X射线三轴晶衍射法测量半绝缘GaAs单晶的化学配比

黎建明 , 屠海令 , 胡广勇 , 王超群 , 郑安生 and 钱嘉裕

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Key words: 晶格参数, 化学配比, 双晶衍射, 三轴晶模式衍射

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    Received: 19 August 2015 Revised: Online: Published: 01 November 2002

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      Article Navigation >  Journal of Semiconductors  > 2002  >  23(11): 1187-1191
      黎建明, 屠海令, 胡广勇, 王超群, 郑安生, 钱嘉裕. X射线三轴晶衍射法测量半绝缘GaAs单晶的化学配比[J]. 半导体学报(英文版), 2002, 23(11): 1187-1191.
      Citation:
      黎建明, 屠海令, 胡广勇, 王超群, 郑安生, 钱嘉裕. X射线三轴晶衍射法测量半绝缘GaAs单晶的化学配比[J]. 半导体学报(英文版), 2002, 23(11): 1187-1191.
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      • Received Date: 2015-08-19

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