Chin. J. Semicond. > 2002, Volume 23 > Issue 8 > 817-824
|

CONTENTS

利用响应表面方法的器件稳健性设计(英文)

谢晓锋 , 鲁勇 , 张文俊 and 杨之廉

+ Author Affiliations

PDF

Key words: 响应表面方法, 实验设计, 器件稳健性设计

    • Search

    Advanced Search >>

    GET CITATION

    shu

    Export: BibTex EndNote

    Article Metrics

    Article views: 2559 Times PDF downloads: 1083 Times Cited by: 0 Times

    History

    Received: 19 August 2015 Revised: Online: Published: 01 August 2002

    Catalog

      Email This Article

      User name:
      Email:*请输入正确邮箱
      Code:*验证码错误
      Send
      Article Navigation >  Journal of Semiconductors  > 2002  >  23(8): 817-824
      谢晓锋, 鲁勇, 张文俊, 杨之廉. 利用响应表面方法的器件稳健性设计(英文)[J]. 半导体学报(英文版), 2002, 23(8): 817-824.
      Citation:
      谢晓锋, 鲁勇, 张文俊, 杨之廉. 利用响应表面方法的器件稳健性设计(英文)[J]. 半导体学报(英文版), 2002, 23(8): 817-824.
      shu

      • Received Date: 2015-08-19

      Catalog

        Journal of Semiconductors © 2017 All Rights Reserved   京ICP备05085259号-2

        /

        DownLoad:  Full-Size Img  PowerPoint
        Return
        Return