Chin. J. Semicond. > 1982, Volume 3 > Issue 3 > 215-221
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电化学C-V法测量半导体材料载流子浓度分布

邵永富 , 陈自姚 and 彭瑞伍

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    Received: 20 August 2015 Revised: Online: Published: 01 March 1982

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      Article Navigation >  Journal of Semiconductors  > 1982  >  3(3): 215-221
      邵永富, 陈自姚, 彭瑞伍. 电化学C-V法测量半导体材料载流子浓度分布[J]. 半导体学报(英文版), 1982, 3(3): 215-221.
      Citation:
      邵永富, 陈自姚, 彭瑞伍. 电化学C-V法测量半导体材料载流子浓度分布[J]. 半导体学报(英文版), 1982, 3(3): 215-221.
      shu

      • Received Date: 2015-08-20

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