Chin. J. Semicond. > 1984, Volume 5 > Issue 4 > 453-456

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K_(CMR)的一个测试方法

李光宇

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    Received: 20 August 2015 Revised: Online: Published: 01 April 1984

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      Article Navigation >  Journal of Semiconductors  > 1984  >  5(4): 453-456
      李光宇. K_(CMR)的一个测试方法[J]. 半导体学报(英文版), 1984, 5(4): 453-456.
      Citation:
      李光宇. K_(CMR)的一个测试方法[J]. 半导体学报(英文版), 1984, 5(4): 453-456.
      shu

      • Received Date: 2015-08-20

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