Citation: |
Li Zheyang, Dong Xun, Bai Song, Chen Gang, Chen Tangsheng, Chen Chen. Epitaxial Growth of 4H-SiC MESFET Structures[J]. Journal of Semiconductors, 2007, 28(S1): 379-381.
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Li Z Y, Dong X, Bai S, Chen G, Chen T S, Chen C. Epitaxial Growth of 4H-SiC MESFET Structures[J]. Chin. J. Semicond., 2007, 28(S1): 379.
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Epitaxial Growth of 4H-SiC MESFET Structures
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Abstract
Metalsemiconductor field effect transistor(MESFET)structures have been grown in a hot-walI CVD reactor. Using trimethylaluminium (TMA) and nitrogen,p-and n-type epitaxial layers were grown on n+substrates and semi insulating substrates.Thickness of epitaxial layer has been characterized using scanning electron microscopy,and doping concentration has been determined by using secondary ion mass spectrometry and Hg probe capacitance-voltage technique.Optimization of growth parameters has resulted in very abrupt doping profiles.The grown MESFET structures have been processed and parts of the transistor properties are presented.-
Keywords:
- 4H·SiC,
- MESFET,
- SEM,
- SIMS,
- Hg probe C-V
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References
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Proportional views