Chin. J. Semicond. > 1999, Volume 20 > Issue 5 > 358-364
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半导体器件热特性的电学法测量与分析

冯士维 , 谢雪松 , 吕长志 , 张小玲 , 何焱 and 沈光地

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    Received: 20 August 2015 Revised: Online: Published: 01 May 1999

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      Article Navigation >  Journal of Semiconductors  > 1999  >  20(5): 358-364
      冯士维, 谢雪松, 吕长志, 张小玲, 何焱, 沈光地. 半导体器件热特性的电学法测量与分析[J]. 半导体学报(英文版), 1999, 20(5): 358-364.
      Citation:
      冯士维, 谢雪松, 吕长志, 张小玲, 何焱, 沈光地. 半导体器件热特性的电学法测量与分析[J]. 半导体学报(英文版), 1999, 20(5): 358-364.
      shu

      • Received Date: 2015-08-20

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