Chin. J. Semicond. > 2002, Volume 23 > Issue 2 > 198-202
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一种有效的IC成品率估算模型

赵天绪 , 郝跃 and 马佩军

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Key words: 功能成品率, 缺陷, 故障率

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    Received: 19 August 2015 Revised: Online: Published: 01 February 2002

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      Article Navigation >  Journal of Semiconductors  > 2002  >  23(2): 198-202
      赵天绪, 郝跃, 马佩军. 一种有效的IC成品率估算模型[J]. 半导体学报(英文版), 2002, 23(2): 198-202.
      Citation:
      赵天绪, 郝跃, 马佩军. 一种有效的IC成品率估算模型[J]. 半导体学报(英文版), 2002, 23(2): 198-202.
      shu

      • Received Date: 2015-08-19

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