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Chin. J. Semicond. > Volume 12 > Issue 10 > Article Number: 583

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ZnSe-ZnTe应变层超晶格的分子束外延生长及特性分析

沈爱东 , 崔捷 , 陈云良 , 徐梁 and 王海龙

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Abstract: 运用MBE/FWIII设备成功地生长了高质量的ZnSe-ZnTe应变层超晶格.对材料的特性进行了俄歇电子能谱、低角度X射线衍射、光荧光及拉曼光谱等分析测试.并首次观测到ZnSe层内6个LO声子限制模.

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History

Manuscript received: 19 August 2015 Manuscript revised: Online: Published: 01 October 1991

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