Chin. J. Semicond. > Volume 14 > Issue 2 > Article Number: 94

隧道谱仪及其应用

陈弘毅

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Abstract: 本文描述隧道谱仪的测量原理,并给出一个隧道谱测量系统的结构。利用该系统测量了硅隧道二极管和分子束外延单晶态CoSi_2/N~+-Si肖特基势垒二极管中的硅声子谱,以及GaAs/Al_xGa_(1-x)As双垒单量子阱中的不同共振隧穿机构。显示了隧道谱仪是研究固体中量子隧穿现象的一种有力工具。

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History

Manuscript received: 20 August 2015 Manuscript revised: Online: Published: 01 February 1993

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