Citation: |
Yu Guanghui, Lei Benliang, Meng Sheng, Wang Xinzhong, Lin Chaotong, Qi Ming. Hydride Vapor Phase Epitaxy of Thick GaN with Low Temperature AIN Interlayers[J]. Journal of Semiconductors, 2007, 28(S1): 238-240.
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Yu G H, Lei B L, Meng S, Wang X Z, Lin C T, Qi M. Hydride Vapor Phase Epitaxy of Thick GaN with Low Temperature AIN Interlayers[J]. Chin. J. Semicond., 2007, 28(S1): 238.
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Hydride Vapor Phase Epitaxy of Thick GaN with Low Temperature AIN Interlayers
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Abstract
Thick GaN films are grown by hydride vapor phase epitaxy with low temperature AIN interlayers(LT·AlN). Influence of annealing time of LT-AlN on the crystalline quality of GaN films is studied.Surface morphology of LT-AlN layers changes after annealing.Crystalline quality can be improved with a suitable LT-AlN annealing time. -
References
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