Chin. J. Semicond. > 1987, Volume 8 > Issue 6 > 637-642
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利用有色散双晶衍射测量完整或近完整晶体的单晶反射系数

陈京一 , 李润身 and 许顺生

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    Received: 19 August 2015 Revised: Online: Published: 01 June 1987

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      Article Navigation >  Journal of Semiconductors  > 1987  >  8(6): 637-642
      陈京一, 李润身, 许顺生. 利用有色散双晶衍射测量完整或近完整晶体的单晶反射系数[J]. 半导体学报(英文版), 1987, 8(6): 637-642.
      Citation:
      陈京一, 李润身, 许顺生. 利用有色散双晶衍射测量完整或近完整晶体的单晶反射系数[J]. 半导体学报(英文版), 1987, 8(6): 637-642.
      shu

      • Received Date: 2015-08-19

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