Chin. J. Semicond. > 1994, Volume 15 > Issue 11 > 774-781
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用激光探针测量半导体器件中的载流子浓度调制效应

江剑平，李艳和，武建平，许知止

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    Received: 19 August 2015 Revised: Online: Published: 01 November 1994

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      Article Navigation >  Journal of Semiconductors  > 1994  >  15(11): 774-781
      江剑平，李艳和，武建平，许知止. 用激光探针测量半导体器件中的载流子浓度调制效应[J]. 半导体学报(英文版), 1994, 15(11): 774-781.
      Citation:
      江剑平，李艳和，武建平，许知止. 用激光探针测量半导体器件中的载流子浓度调制效应[J]. 半导体学报(英文版), 1994, 15(11): 774-781.
      shu

      • Received Date: 2015-08-19

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