Citation: |
Swagata Dey, Vedatrayee Chakraborty, Bratati Mukhopadhyay, Gopa Sen. Modeling of tunneling current density of GeC based double barrier multiple quantum well resonant tunneling diode[J]. Journal of Semiconductors, 2018, 39(10): 104003. doi: 10.1088/1674-4926/39/10/104003
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S Dey, V Chakraborty, B Mukhopadhyay, G Sen, Modeling of tunneling current density of GeC based double barrier multiple quantum well resonant tunneling diode[J]. J. Semicond., 2018, 39(10): 104003. doi: 10.1088/1674-4926/39/10/104003.
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Modeling of tunneling current density of GeC based double barrier multiple quantum well resonant tunneling diode
doi: 10.1088/1674-4926/39/10/104003
More Information-
Abstract
The double barrier quantum well (DBQW) resonant tunneling diode (RTD) structure made of SiGeSn/GeC/SiGeSn alloys grown on Ge substrate is analyzed. The tensile strained Ge1−zCz on Si1−x−yGexSny heterostructure provides a direct band gap type I configuration. The transmission coefficient and tunneling current density have been calculated considering single and multiple quantum wells. A comparative study of tunnelling current of the proposed structure is done with the existing RTD structure based on GeSn/SiGeSn DBH. A higher value of the current density for the proposed structure has been obtained.-
Keywords:
- DBQW,
- MQW,
- RTD,
- NDR,
- tunneling current density
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References
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