Chin. J. Semicond. > 1993, Volume 14 > Issue 5 > 322-324
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发光多孔硅高分辨电镜分析

鲍希茂 , 闫锋 , 柳承恩 , 郑祥钦 , 王路春 , 朱健民 and 李齐

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    Received: 20 August 2015 Revised: Online: Published: 01 May 1993

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      Article Navigation >  Journal of Semiconductors  > 1993  >  14(5): 322-324
      鲍希茂, 闫锋, 柳承恩, 郑祥钦, 王路春, 朱健民, 李齐. 发光多孔硅高分辨电镜分析[J]. 半导体学报(英文版), 1993, 14(5): 322-324.
      Citation:
      鲍希茂, 闫锋, 柳承恩, 郑祥钦, 王路春, 朱健民, 李齐. 发光多孔硅高分辨电镜分析[J]. 半导体学报(英文版), 1993, 14(5): 322-324.
      shu

      • Received Date: 2015-08-20

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