Chin. J. Semicond. > 2002, Volume 23 > Issue 10 > 1083-1087
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雾化热解法制备ZnO薄膜及其光电性能

杨成兴 , 季振国 , 刘坤 , 樊瑞新 and 叶志镇

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Key words: ZnO薄膜, 雾化裂解, X射线衍射分析, 电学及光学性能

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    Received: 19 August 2015 Revised: Online: Published: 01 October 2002

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      Article Navigation >  Journal of Semiconductors  > 2002  >  23(10): 1083-1087
      杨成兴, 季振国, 刘坤, 樊瑞新, 叶志镇. 雾化热解法制备ZnO薄膜及其光电性能[J]. 半导体学报(英文版), 2002, 23(10): 1083-1087.
      Citation:
      杨成兴, 季振国, 刘坤, 樊瑞新, 叶志镇. 雾化热解法制备ZnO薄膜及其光电性能[J]. 半导体学报(英文版), 2002, 23(10): 1083-1087.
      shu

      • Received Date: 2015-08-19

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