Chin. J. Semicond. > 1996, Volume 17 > Issue 6 > 416-420
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表面包覆硬脂酸的纳米SnO_2的XRD、ESR、FTIR光谱特征

吴晓春，邹炳锁，张桂兰，汤国庆，余保龙，陈文驹，郭虎森，刘月亭

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    Received: 18 August 2015 Revised: Online: Published: 01 June 1996

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      Article Navigation >  Journal of Semiconductors  > 1996  >  17(6): 416-420
      吴晓春，邹炳锁，张桂兰，汤国庆，余保龙，陈文驹，郭虎森，刘月亭. 表面包覆硬脂酸的纳米SnO_2的XRD、ESR、FTIR光谱特征[J]. 半导体学报(英文版), 1996, 17(6): 416-420.
      Citation:
      吴晓春，邹炳锁，张桂兰，汤国庆，余保龙，陈文驹，郭虎森，刘月亭. 表面包覆硬脂酸的纳米SnO_2的XRD、ESR、FTIR光谱特征[J]. 半导体学报(英文版), 1996, 17(6): 416-420.
      shu

      • Received Date: 2015-08-18

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