Chin. J. Semicond. > 1980, Volume 1 > Issue 4 > 329-332
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大规模集成电路测试图案产生方法的研究,

林雨

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    Received: 20 August 2015 Revised: Online: Published: 01 April 1980

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      Article Navigation >  Journal of Semiconductors  > 1980  >  1(4): 329-332
      林雨. 大规模集成电路测试图案产生方法的研究,[J]. 半导体学报(英文版), 1980, 1(4): 329-332.
      Citation:
      林雨. 大规模集成电路测试图案产生方法的研究,[J]. 半导体学报(英文版), 1980, 1(4): 329-332.
      shu

      • Received Date: 2015-08-20

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