Chin. J. Semicond. > 1992, Volume 13 > Issue 11 > 690-697
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单晶外延层厚度的X射线双晶衍射测定

朱南昌 , 李润身 , 陈京一 and 许顺生

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    Received: 19 August 2015 Revised: Online: Published: 01 November 1992

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      Article Navigation >  Journal of Semiconductors  > 1992  >  13(11): 690-697
      朱南昌, 李润身, 陈京一, 许顺生. 单晶外延层厚度的X射线双晶衍射测定[J]. 半导体学报(英文版), 1992, 13(11): 690-697.
      Citation:
      朱南昌, 李润身, 陈京一, 许顺生. 单晶外延层厚度的X射线双晶衍射测定[J]. 半导体学报(英文版), 1992, 13(11): 690-697.
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      • Received Date: 2015-08-19

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