Chin. J. Semicond. > 1983, Volume 4 > Issue 5 > 439-443
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电场对TSIC测量的影响

谭长华 and 许铭真

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    Received: 20 August 2015 Revised: Online: Published: 01 May 1983

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      Article Navigation >  Journal of Semiconductors  > 1983  >  4(5): 439-443
      谭长华, 许铭真. 电场对TSIC测量的影响[J]. 半导体学报(英文版), 1983, 4(5): 439-443.
      Citation:
      谭长华, 许铭真. 电场对TSIC测量的影响[J]. 半导体学报(英文版), 1983, 4(5): 439-443.
      shu

      • Received Date: 2015-08-20

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