Chin. J. Semicond. > Volume 10 > Issue 12 > Article Number: 955

重掺Ⅲ-Ⅴ族化合物半导体载流子浓度的光测法研究

徐谨民 , 邵丽影 and 吴敏

+ Author Affiliations + Find other works by these authors

PDF

Abstract: 本文应用计算机,绘出各类重掺Ⅲ-Ⅴ族化合物半导体在不同等离子频率ω_p下的反射率曲线,从中找出了反射谱的高低频反射边在反射率极小值处所对应的频率ω_1与ω_2之和与ω_p间的函数关系.并应用此关系对不同载流子浓度的重掺Ⅲ-Ⅴ族化合物半导体GaAs和Inp样品进行实验上的验证,获得了满意的结果.

Search

Advanced Search >>

Article Metrics

Article views: 1796 Times PDF downloads: 1241 Times Cited by: 0 Times

History

Manuscript received: 19 August 2015 Manuscript revised: Online: Published: 01 December 1989

Email This Article

User name:
Email:*请输入正确邮箱
Code:*验证码错误