Chin. J. Semicond. > 1994, Volume 15 > Issue 6 > 373-382
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Si／Si1－xGex应变层超晶格折叠声子能隙的精细测量

张鹏翔 , D. J. Lockwood , J. M. Baribeau and H. J. Labbe

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    Received: 18 August 2015 Revised: Online: Published: 01 June 1994

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      Article Navigation >  Journal of Semiconductors  > 1994  >  15(6): 373-382
      张鹏翔, D. J. Lockwood, J. M. Baribeau, H. J. Labbe. Si／Si1－xGex应变层超晶格折叠声子能隙的精细测量[J]. 半导体学报(英文版), 1994, 15(6): 373-382.
      Citation:
      张鹏翔, D. J. Lockwood, J. M. Baribeau, H. J. Labbe. Si／Si1－xGex应变层超晶格折叠声子能隙的精细测量[J]. 半导体学报(英文版), 1994, 15(6): 373-382.
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      • Received Date: 2015-08-18

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