Chin. J. Semicond. > 2001, Volume 22 > Issue 1 > 69-73
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电荷泵法研究FLASH擦工作时带带隧穿引起的界面损伤

苏昱 , 朱钧 , 陈宇川 , 潘立阳 and 刘志弘

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Key words: 带带隧穿, 电荷泵, 倍增因子

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    Received: 19 August 2015 Revised: Online: Published: 01 January 2001

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      Article Navigation >  Journal of Semiconductors  > 2001  >  22(1): 69-73
      苏昱, 朱钧, 陈宇川, 潘立阳, 刘志弘. 电荷泵法研究FLASH擦工作时带带隧穿引起的界面损伤[J]. 半导体学报(英文版), 2001, 22(1): 69-73.
      Citation:
      苏昱, 朱钧, 陈宇川, 潘立阳, 刘志弘. 电荷泵法研究FLASH擦工作时带带隧穿引起的界面损伤[J]. 半导体学报(英文版), 2001, 22(1): 69-73.
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      • Received Date: 2015-08-19

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