J. Semicond. 2008, 29(1): 1
Low-Temperature Growth of ZnO Films on GaAs by Metal Organic Chemical Vapor Deposition
J. Semicond. 2008, 29(1): 12
Polysilicon Over-Etching Time Control of Advanced CMOS Processing with Emission Microscopy
J. Semicond. 2008, 29(1): 17
J. Semicond. 2008, 29(1): 20
A Near-1V 10ppm/℃ CMOS Bandgap Reference with Curvature Compensation
J. Semicond. 2008, 29(1): 24
Optical and Electrical Properties of GaN:Mg Grown by MOCVD
J. Semicond. 2008, 29(1): 29
Organic Light-Emitting Diodes by Doping Liq into an Electron Transport Layer
J. Semicond. 2008, 29(1): 33
RTD’s Relaxation Oscillation Characteristics with Applied Pressure
J. Semicond. 2008, 29(1): 39
J. Semicond. 2008, 29(1): 45
Organic,Bistable Devices with AgTCNQ Charge Transfer Complex by Vacuum Co-Deposition
J. Semicond. 2008, 29(1): 50
J. Semicond. 2008, 29(1): 55
A 12~18GHz Wide Band VCO Based on Quasi-MMIC
J. Semicond. 2008, 29(1): 63
A Robust Low Power Chaos-Based Truly Random Number Generator
J. Semicond. 2008, 29(1): 69
A CMOS Dynamic Comparator for Pipelined ADCs with Improved Speed/Power Ratio
J. Semicond. 2008, 29(1): 75
A Statistical Method for Characterizing CMOS Process Fluctuations in Subthreshold Current Mirrors
J. Semicond. 2008, 29(1): 82
Fast-Lock Low-Jitter PLL with a Simple Phase-Frequency Detector
J. Semicond. 2008, 29(1): 88
Low Power Design Orienting 384×288 Snapshot Infrared Readout Integrated Circuits
J. Semicond. 2008, 29(1): 93
A Low-Power,Single-Poly,Non-Volatile Memory for Passive RFID Tags
J. Semicond. 2008, 29(1): 99
Bandgap Energies in Strain-Free Ga1-xInxNyAs-y/GaAs QWs After Annealing
J. Semicond. 2008, 29(1): 105
A Simulation of the Capacitance-Voltage Characteristics of a Ge/Si Quantum-Well Structure
J. Semicond. 2008, 29(1): 110
PL Emission of Low-Dimensional Structures Formed by Laser Irradiation
J. Semicond. 2008, 29(1): 116
J. Semicond. 2008, 29(1): 123
Growth of p-GaN on High-Temperature AlN Templates
J. Semicond. 2008, 29(1): 128
Properties of CdTe Source Prepared by Close-Spaced Sublimation in O2 Atmosphere
J. Semicond. 2008, 29(1): 133
Design,Fabrication,and Characterization of Dual Channel Real Space Transfer Transistors
J. Semicond. 2008, 29(1): 136
Fabrication and Memory Characteristics of a New Organic Thin Film Device
J. Semicond. 2008, 29(1): 140
J. Semicond. 2008, 29(1): 144
A Novel Back-Gate Kink Effect in SOI MOSFETs During Ionizing Irradiation
J. Semicond. 2008, 29(1): 149
Hydrogen Sensors Based on AlGaN/GaN Back-to-Back Schottky Diodes
J. Semicond. 2008, 29(1): 153
Thermally Induced Packaging Effect on the Resonant Frequencies of a Fixed-Fixed Beam
J. Semicond. 2008, 29(1): 157
Analysis of Pull-In Voltage of RF MEMS Switches
J. Semicond. 2008, 29(1): 163
Micro-Sized SnAg Solder Bumping Technology and Bonding Reliability
J. Semicond. 2008, 29(1): 168
Electromigration of Cu-Ni/Solder/Ni-Cu Structures
J. Semicond. 2008, 29(1): 174
Intermediate Layer Bonding for Silicon and Glass Based on UV Adhesive
J. Semicond. 2008, 29(1): 179
A Metropolis Monte Carlo Simulation Approach for Anisotropic Wet Etching and Its Applications
J. Semicond. 2008, 29(1): 183